Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films

Digests of the Intermag Conference

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書目詳細資料
Main Authors: Leong, Siang Huei, Wang, Jian Ping, Low, Teck Seng
其他作者: ELECTRICAL ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/71883
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機構: National University of Singapore