Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films

Digests of the Intermag Conference

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Bibliographic Details
Main Authors: Leong, Siang Huei, Wang, Jian Ping, Low, Teck Seng
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71883
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Institution: National University of Singapore