Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films

Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films

Digests of the Intermag Conference

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Main Authors: Leong, Siang Huei, Wang, Jian Ping, Low, Teck Seng
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71883
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-718832015-02-06T07:24:01Z Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films Leong, Siang Huei Wang, Jian Ping Low, Teck Seng ELECTRICAL ENGINEERING ELECTRICAL & COMPUTER ENGINEERING Digests of the Intermag Conference AE-08 DICOD 2014-06-19T03:28:55Z 2014-06-19T03:28:55Z 2000 Conference Paper Leong, Siang Huei,Wang, Jian Ping,Low, Teck Seng (2000). Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films. Digests of the Intermag Conference : AE-08. ScholarBank@NUS Repository. 00746843 http://scholarbank.nus.edu.sg/handle/10635/71883 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Digests of the Intermag Conference
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Leong, Siang Huei
Wang, Jian Ping
Low, Teck Seng
format Conference or Workshop Item
author Leong, Siang Huei
Wang, Jian Ping
Low, Teck Seng
spellingShingle Leong, Siang Huei
Wang, Jian Ping
Low, Teck Seng
Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
author_sort Leong, Siang Huei
title Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
title_short Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
title_full Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
title_fullStr Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
title_full_unstemmed Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
title_sort study of in-depth defects using magneto-optical kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/71883
_version_ 1681087464794488832

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