Planning accelerated life tests with three constant stress levels

Planning accelerated life tests with three constant stress levels

10.1016/S0360-8352(02)00040-2

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Bibliographic Details
Main Authors: Tang, L.-C., Tan, A.-P., Ong, S.-H.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Accelerated life testing
Multiple stress levels
Weibull distribution
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72375
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Institution: National University of Singapore
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Summary:10.1016/S0360-8352(02)00040-2

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