Accurate ray tracing through finite element solved potential distributions in charged particle optics

Proceedings of SPIE - The International Society for Optical Engineering

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Bibliographic Details
Main Authors: Aiming, Zhu, Khursheed, A.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72452
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Institution: National University of Singapore