Automaton-based fault detection and isolation

10.1016/S0098-1354(99)80053-2

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Bibliographic Details
Main Authors: Philips, P., Ramkumar, K.B., Lim, K.W., Preisig, H.A., Weiss, M.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72504
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Institution: National University of Singapore
Description
Summary:10.1016/S0098-1354(99)80053-2