Ooi, J., Ling, C., & ENGINEERING, E. (2014). Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors.
Chicago Style CitationOoi, J.A., C.H Ling, and ELECTRICAL ENGINEERING. Comparison of Fowler-Nordheim Stress On Tungsten Polycided and Non-polycided MOS Capacitors. 2014.
MLA CitationOoi, J.A., C.H Ling, and ELECTRICAL ENGINEERING. Comparison of Fowler-Nordheim Stress On Tungsten Polycided and Non-polycided MOS Capacitors. 2014.
Warning: These citations may not always be 100% accurate.