Ooi, J., Ling, C., & ENGINEERING, E. (2014). Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors.
استشهاد بنمط شيكاغوOoi, J.A., C.H Ling, و ELECTRICAL ENGINEERING. Comparison of Fowler-Nordheim Stress On Tungsten Polycided and Non-polycided MOS Capacitors. 2014.
MLA استشهادOoi, J.A., C.H Ling, و ELECTRICAL ENGINEERING. Comparison of Fowler-Nordheim Stress On Tungsten Polycided and Non-polycided MOS Capacitors. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.