Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-727542015-02-08T02:33:44Z Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 127-132 00234 2014-06-19T05:11:38Z 2014-06-19T05:11:38Z 1997 Conference Paper Lou, C.L.,Qin, W.H.,Chim, W.K.,Chan, D.S.H. (1997). Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 127-132. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72754 NOT_IN_WOS Scopus |
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National University of Singapore |
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Singapore |
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ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H. |
| format |
Conference or Workshop Item |
| author |
Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H. |
| spellingShingle |
Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H. Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs |
| author_sort |
Lou, C.L. |
| title |
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs |
| title_short |
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs |
| title_full |
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs |
| title_fullStr |
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs |
| title_full_unstemmed |
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs |
| title_sort |
modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer ldd pmosfets |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72754 |
| _version_ |
1681087623319257088 |