Prediction of defects in PZT thin film using ab-initio method

Prediction of defects in PZT thin film using ab-initio method

10.4028/0-87849-475-8.53

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Bibliographic Details
Main Authors: Zhang, Z., Lu, L., Wu, P., Shu, C.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Ab-initio calculation
Defect
Doping
PZT
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73770
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/73770

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