Nondestructive testing and evaluation using phase-shifting electronic shearography

Proceedings of SPIE - The International Society for Optical Engineering

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Bibliographic Details
Main Authors: Xie, L., Chau, Fook S., Toh, Siew-Lok
Other Authors: MECHANICAL & PRODUCTION ENGINEERING
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/75049
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Institution: National University of Singapore
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