Combining model checking and testing with an application to reliability prediction and distribution

10.1145/2483760.2483779

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Bibliographic Details
Main Authors: Gui, L., Sun, J., Liu, Y., Si, Y.J., Dong, J.S., Wang, X.Y.
Other Authors: COMPUTER SCIENCE
Format: Conference or Workshop Item
Published: 2014
Subjects:
MDP
Online Access:http://scholarbank.nus.edu.sg/handle/10635/78062
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Institution: National University of Singapore
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