Building-in reliability for silver die attached light emitting diodes
Microelectronics Reliability
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sg-nus-scholar.10635-803102015-01-14T15:10:09Z Building-in reliability for silver die attached light emitting diodes Chim, W.K. Chong, K.Y. ELECTRICAL ENGINEERING Microelectronics Reliability 34 3 495-507 MCRLA 2014-10-07T02:56:07Z 2014-10-07T02:56:07Z 1994-03 Article Chim, W.K.,Chong, K.Y. (1994-03). Building-in reliability for silver die attached light emitting diodes. Microelectronics Reliability 34 (3) : 495-507. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/80310 NOT_IN_WOS Scopus |
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National University of Singapore |
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Singapore |
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Microelectronics Reliability |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Chim, W.K. Chong, K.Y. |
| format |
Article |
| author |
Chim, W.K. Chong, K.Y. |
| spellingShingle |
Chim, W.K. Chong, K.Y. Building-in reliability for silver die attached light emitting diodes |
| author_sort |
Chim, W.K. |
| title |
Building-in reliability for silver die attached light emitting diodes |
| title_short |
Building-in reliability for silver die attached light emitting diodes |
| title_full |
Building-in reliability for silver die attached light emitting diodes |
| title_fullStr |
Building-in reliability for silver die attached light emitting diodes |
| title_full_unstemmed |
Building-in reliability for silver die attached light emitting diodes |
| title_sort |
building-in reliability for silver die attached light emitting diodes |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80310 |
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