Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester

10.1063/1.112385

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Bibliographic Details
Main Authors: Phang, J.C.H., Sim, K.S., Chan, D.S.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80325
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-803252023-10-26T07:56:08Z Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester Phang, J.C.H. Sim, K.S. Chan, D.S.H. ELECTRICAL ENGINEERING 10.1063/1.112385 Applied Physics Letters 65 26 3341-3343 2014-10-07T02:56:17Z 2014-10-07T02:56:17Z 1994 Article Phang, J.C.H., Sim, K.S., Chan, D.S.H. (1994). Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester. Applied Physics Letters 65 (26) : 3341-3343. ScholarBank@NUS Repository. https://doi.org/10.1063/1.112385 00036951 http://scholarbank.nus.edu.sg/handle/10635/80325 A1994PY28000013 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.112385
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Phang, J.C.H.
Sim, K.S.
Chan, D.S.H.
format Article
author Phang, J.C.H.
Sim, K.S.
Chan, D.S.H.
spellingShingle Phang, J.C.H.
Sim, K.S.
Chan, D.S.H.
Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
author_sort Phang, J.C.H.
title Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
title_short Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
title_full Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
title_fullStr Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
title_full_unstemmed Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
title_sort charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/80325
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