Effects of thermal stress on low-temperature-grown GaAs and Al0.3Ga0.7As MISFET parameters

Effects of thermal stress on low-temperature-grown GaAs and Al0.3Ga0.7As MISFET parameters

Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

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Bibliographic Details
Main Authors: Rao, Rapeta V.V.V.J., Chong, T.C., Tan, L.S., Lau, W.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80381
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Institution: National University of Singapore
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Summary:Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

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