Golden-template self-generating method for patterned wafer inspection
Machine Vision and Applications
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sg-nus-scholar.10635-805062023-10-31T21:11:05Z Golden-template self-generating method for patterned wafer inspection Xie, P. Guan, S.-U. ELECTRICAL ENGINEERING Machine Vision and Applications 12 3 149-156 MVAPE 2014-10-07T02:58:16Z 2014-10-07T02:58:16Z 2000-10 Article Xie, P., Guan, S.-U. (2000-10). Golden-template self-generating method for patterned wafer inspection. Machine Vision and Applications 12 (3) : 149-156. ScholarBank@NUS Repository. 09328092 http://scholarbank.nus.edu.sg/handle/10635/80506 000089927000005 Scopus |
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Machine Vision and Applications |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Xie, P. Guan, S.-U. |
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Xie, P. Guan, S.-U. |
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Xie, P. Guan, S.-U. Golden-template self-generating method for patterned wafer inspection |
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Xie, P. |
title |
Golden-template self-generating method for patterned wafer inspection |
title_short |
Golden-template self-generating method for patterned wafer inspection |
title_full |
Golden-template self-generating method for patterned wafer inspection |
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Golden-template self-generating method for patterned wafer inspection |
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Golden-template self-generating method for patterned wafer inspection |
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golden-template self-generating method for patterned wafer inspection |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/80506 |
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