Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature
Japanese Journal of Applied Physics, Part 2: Letters
Saved in:
Main Authors: | , , , |
---|---|
Other Authors: | |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81031 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-81031 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-810312015-02-21T11:54:30Z Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature Lau, Wai Shing Goo, Chuen Hang Chong, Tow Chong Chu, Paul K. ELECTRICAL ENGINEERING Japanese Journal of Applied Physics, Part 2: Letters 32 9 A L1192-L1195 JAPLD 2014-10-07T03:03:55Z 2014-10-07T03:03:55Z 1993-09-01 Article Lau, Wai Shing,Goo, Chuen Hang,Chong, Tow Chong,Chu, Paul K. (1993-09-01). Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature. Japanese Journal of Applied Physics, Part 2: Letters 32 (9 A) : L1192-L1195. ScholarBank@NUS Repository. 00214922 http://scholarbank.nus.edu.sg/handle/10635/81031 NOT_IN_WOS Scopus |
institution |
National University of Singapore |
building |
NUS Library |
country |
Singapore |
collection |
ScholarBank@NUS |
description |
Japanese Journal of Applied Physics, Part 2: Letters |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING Lau, Wai Shing Goo, Chuen Hang Chong, Tow Chong Chu, Paul K. |
format |
Article |
author |
Lau, Wai Shing Goo, Chuen Hang Chong, Tow Chong Chu, Paul K. |
spellingShingle |
Lau, Wai Shing Goo, Chuen Hang Chong, Tow Chong Chu, Paul K. Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature |
author_sort |
Lau, Wai Shing |
title |
Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature |
title_short |
Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature |
title_full |
Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature |
title_fullStr |
Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature |
title_full_unstemmed |
Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature |
title_sort |
quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/81031 |
_version_ |
1681088997193940992 |