Simulation of charge pumping current in hot-carrier degraded p-MOSFET's

Simulation of charge pumping current in hot-carrier degraded p-MOSFET's

IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

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Bibliographic Details
Main Authors: Samudra, G.S., Yip, Anselm, See, L.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81173
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Institution: National University of Singapore
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Summary:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

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