Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope

Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA

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Main Authors:	Tao, J.M., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81376
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81376
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spelling	sg-nus-scholar.10635-813762015-01-14T07:01:36Z Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope Tao, J.M. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 33-38 234 2014-10-07T03:07:39Z 2014-10-07T03:07:39Z 1997 Conference Paper Tao, J.M.,Chim, W.K.,Chan, D.S.H.,Phang, J.C.H.,Liu, Y.Y. (1997). Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 33-38. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81376 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Tao, J.M. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y.
format	Conference or Workshop Item
author	Tao, J.M. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y.
spellingShingle	Tao, J.M. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y. Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
author_sort	Tao, J.M.
title	Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
title_short	Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
title_full	Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
title_fullStr	Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
title_full_unstemmed	Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
title_sort	analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81376
_version_	1681089059979526144

Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope

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