Fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tables

IECON Proceedings (Industrial Electronics Conference)

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Bibliographic Details
Main Authors: Ramkumar, K.B., Druckenmueller, M., Xi, Y.X., Philips, P., Presig, H.A., Ho, W.K., Lim, K.W.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81416
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Institution: National University of Singapore
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Summary:IECON Proceedings (Industrial Electronics Conference)