Laser cleaning of microparticles - Theoretical prediction of threshold laser fluence

• Main Authors: Lu, Y.F., Song, W.D., Hong, M.H., Chan, D.S.H., Low, T.S.
• Other Authors: DATA STORAGE INSTITUTE
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Cleaning force; Cleaning threshold; Laser cleaning; Microparticles; Van der Waals force
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/81512
• Institution: National University of Singapore

Proceedings of SPIE - The International Society for Optical Engineering