Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs

Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA

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Main Authors:	Lou, C.L., Qin, W.H., Chim, W.K., Chan, D.S.H.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81549
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81549
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spelling	sg-nus-scholar.10635-815492015-02-09T06:34:02Z Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 127-132 234 2014-10-07T03:09:30Z 2014-10-07T03:09:30Z 1997 Conference Paper Lou, C.L.,Qin, W.H.,Chim, W.K.,Chan, D.S.H. (1997). Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 127-132. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81549 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H.
format	Conference or Workshop Item
author	Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H.
spellingShingle	Lou, C.L. Qin, W.H. Chim, W.K. Chan, D.S.H. Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
author_sort	Lou, C.L.
title	Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
title_short	Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
title_full	Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
title_fullStr	Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
title_full_unstemmed	Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
title_sort	modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer ldd pmosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81549
_version_	1681089091525935104

Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs

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