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Liu, X., D.S.H Chan, W.K Chim, J.C.H Phang, و ELECTRICAL ENGINEERING. Evaluation of Electrical Stress Effects On SiO2-Si Structures Using Scanning Electron Microscope Cathodoluminescence. 2014.

Liu, X., et al. Evaluation of Electrical Stress Effects On SiO2-Si Structures Using Scanning Electron Microscope Cathodoluminescence. 2014.