APA Citation

Liu, X., Chan, D., Chim, W., Phang, J., & ENGINEERING, E. (2014). Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescence.

Chicago Style Citation

Liu, X., D.S.H Chan, W.K Chim, J.C.H Phang, and ELECTRICAL ENGINEERING. Evaluation of Electrical Stress Effects On SiO2-Si Structures Using Scanning Electron Microscope Cathodoluminescence. 2014.

MLA Citation

Liu, X., et al. Evaluation of Electrical Stress Effects On SiO2-Si Structures Using Scanning Electron Microscope Cathodoluminescence. 2014.

Warning: These citations may not always be 100% accurate.