Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case

10.1109/TMAG.2003.819468

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Bibliographic Details
Main Authors:	Yin, W.-Y., Gan, Y.-B., Pan, S., Li, L.-W., Ooi, B.-L.
Other Authors:	TEMASEK LABORATORIES
Format:	Article
Published:	2014
Subjects:	Equivalent circuit First resonant frequency On-chip inductor and capacitor serial interconnect (L-Cs) S parameter
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82320
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82320
record_format	dspace
spelling	sg-nus-scholar.10635-823202023-10-27T07:29:43Z Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case Yin, W.-Y. Gan, Y.-B. Pan, S. Li, L.-W. Ooi, B.-L. TEMASEK LABORATORIES ELECTRICAL & COMPUTER ENGINEERING Equivalent circuit First resonant frequency On-chip inductor and capacitor serial interconnect (L-Cs) S parameter 10.1109/TMAG.2003.819468 IEEE Transactions on Magnetics 39 6 3497-3502 IEMGA 2014-10-07T04:27:59Z 2014-10-07T04:27:59Z 2003-11 Article Yin, W.-Y., Gan, Y.-B., Pan, S., Li, L.-W., Ooi, B.-L. (2003-11). Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case. IEEE Transactions on Magnetics 39 (6) : 3497-3502. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2003.819468 00189464 http://scholarbank.nus.edu.sg/handle/10635/82320 000187434200007 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Equivalent circuit First resonant frequency On-chip inductor and capacitor serial interconnect (L-Cs) S parameter
spellingShingle	Equivalent circuit First resonant frequency On-chip inductor and capacitor serial interconnect (L-Cs) S parameter Yin, W.-Y. Gan, Y.-B. Pan, S. Li, L.-W. Ooi, B.-L. Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case
description	10.1109/TMAG.2003.819468
author2	TEMASEK LABORATORIES
author_facet	TEMASEK LABORATORIES Yin, W.-Y. Gan, Y.-B. Pan, S. Li, L.-W. Ooi, B.-L.
format	Article
author	Yin, W.-Y. Gan, Y.-B. Pan, S. Li, L.-W. Ooi, B.-L.
author_sort	Yin, W.-Y.
title	Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case
title_short	Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case
title_full	Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case
title_fullStr	Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case
title_full_unstemmed	Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case
title_sort	experimental characterization of on-chip inductor and capacitor interconnect: part i. series case
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82320
_version_	1781784108153700352

Experimental Characterization of On-Chip Inductor and Capacitor Interconnect: Part I. Series Case

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