Profiling nanowire thermal resistance with a spatial resolution of nanometers

10.1021/nl4041516

Saved in:
Bibliographic Details
Main Authors: Liu, D., Xie, R., Yang, N., Li, B., Thong, J.T.L.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82936
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore