Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure
Physical Review B - Condensed Matter and Materials Physics
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sg-nus-scholar.10635-829582015-01-09T11:54:59Z Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure Liu, L. Teo, K.L. Shen, Z.X. Sun, J.S. Ong, E.H. Kolobov, A.V. Maeda, Y. PHYSICS ELECTRICAL & COMPUTER ENGINEERING Physical Review B - Condensed Matter and Materials Physics 69 12 1253331-1253337 PRBMD 2014-10-07T04:35:32Z 2014-10-07T04:35:32Z 2004-03 Article Liu, L.,Teo, K.L.,Shen, Z.X.,Sun, J.S.,Ong, E.H.,Kolobov, A.V.,Maeda, Y. (2004-03). Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure. Physical Review B - Condensed Matter and Materials Physics 69 (12) : 1253331-1253337. ScholarBank@NUS Repository. 01631829 http://scholarbank.nus.edu.sg/handle/10635/82958 NOT_IN_WOS Scopus |
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Physical Review B - Condensed Matter and Materials Physics |
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PHYSICS Liu, L. Teo, K.L. Shen, Z.X. Sun, J.S. Ong, E.H. Kolobov, A.V. Maeda, Y. |
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Liu, L. Teo, K.L. Shen, Z.X. Sun, J.S. Ong, E.H. Kolobov, A.V. Maeda, Y. |
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Liu, L. Teo, K.L. Shen, Z.X. Sun, J.S. Ong, E.H. Kolobov, A.V. Maeda, Y. Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure |
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Liu, L. |
title |
Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure |
title_short |
Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure |
title_full |
Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure |
title_fullStr |
Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure |
title_full_unstemmed |
Raman scattering investigation of a Ge/SiO2/Si nanocrystal system under hydrostatic pressure |
title_sort |
raman scattering investigation of a ge/sio2/si nanocrystal system under hydrostatic pressure |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/82958 |
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