APA引文

Ang, C., Tan, S., Lek, C., Lin, W., Zheng, Z., Chen, T., . . . ENGINEERING, E. &. C. (2014). Suppression of nitridation-induced interface traps and hole mobility degradation by nitrogen plasma nitridation.

Chicago Style Citation

Ang, C.H., S.S Tan, C.M Lek, W. Lin, Z.J Zheng, T. Chen, B.J Cho, and ELECTRICAL & COMPUTER ENGINEERING. Suppression of Nitridation-induced Interface Traps and Hole Mobility Degradation By Nitrogen Plasma Nitridation. 2014.

MLA引文

Ang, C.H., et al. Suppression of Nitridation-induced Interface Traps and Hole Mobility Degradation By Nitrogen Plasma Nitridation. 2014.