The coloration and degradation mechanisms of electrochromic nickel oxide

10.1016/j.solmat.2013.03.042

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Bibliographic Details
Main Authors: Ren, Y., Chim, W.K., Guo, L., Tanoto, H., Pan, J., Chiam, S.Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83158
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Institution: National University of Singapore

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