The coloration and degradation mechanisms of electrochromic nickel oxide
10.1016/j.solmat.2013.03.042
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Main Authors: | Ren, Y., Chim, W.K., Guo, L., Tanoto, H., Pan, J., Chiam, S.Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83158 |
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Institution: | National University of Singapore |
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