Thermomigration-induced magnetic degradation of current perpendicular to the plane giant magnetoresistance spin-valve read sensors operating at high current density

Thermomigration-induced magnetic degradation of current perpendicular to the plane giant magnetoresistance spin-valve read sensors operating at high current density

10.1063/1.3260250

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Bibliographic Details
Main Authors: Zeng, D.G., Chung, K.-W., Bae, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83201
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/83201

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