Using the Monte Carlo approach to study effects of power measurement uncertainties on six-port reflectometer performance

10.1088/0957-0233/21/2/025103

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Bibliographic Details
Main Authors: Yao, J.J., Yeo, S.P.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83253
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Institution: National University of Singapore