Variable range hopping in TiO2 insulating layers for oxide electronic devices

Variable range hopping in TiO2 insulating layers for oxide electronic devices

10.1063/1.3682346

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Bibliographic Details
Main Authors: Zhao, Y.L., Lv, W.M., Liu, Z.Q., Zeng, S.W., Motapothula, M., Dhar, S., Ariando, Wang, Q., Venkatesan, T.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83255
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/83255

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