Ding, Y., Cheng, R., Koh, S., Liu, B., Gyanathan, A., Zhou, Q., . . . ENGINEERING, E. &. C. (2014). A new Ge 2Sb 2Te 5 (GST) liner stressor featuring stress enhancement due to amorphous-crystalline phase change for sub-20 nm p-channel FinFETs.
Chicago Style CitationDing, Y., et al. A New Ge 2Sb 2Te 5 (GST) Liner Stressor Featuring Stress Enhancement Due to Amorphous-crystalline Phase Change for Sub-20 Nm P-channel FinFETs. 2014.
MLA引文Ding, Y., et al. A New Ge 2Sb 2Te 5 (GST) Liner Stressor Featuring Stress Enhancement Due to Amorphous-crystalline Phase Change for Sub-20 Nm P-channel FinFETs. 2014.
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