Consistent and reliable MESFET parasitic capacitance extraction method

10.1049/ip-map:20040128

Saved in:
Bibliographic Details
Main Authors: Ooi, B.L., Ma, J.Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83577
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore