Novel method for quantifying optical losses of glass and encapsulant materials of silicon wafer based PV modules

10.1016/j.egypro.2012.02.049

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Bibliographic Details
Main Authors: Khoo, Y.S., Walsh, T.M., Aberle, A.G.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/84018
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Institution: National University of Singapore