Towards ultimate CMOS performance with new stressor materials
10.1109/ICSICT.2008.4734488
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sg-nus-scholar.10635-843172023-10-25T22:15:51Z Towards ultimate CMOS performance with new stressor materials Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/ICSICT.2008.4734488 International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT 121-125 2014-10-07T04:51:17Z 2014-10-07T04:51:17Z 2008 Conference Paper Yeo, Y.-C. (2008). Towards ultimate CMOS performance with new stressor materials. International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT : 121-125. ScholarBank@NUS Repository. https://doi.org/10.1109/ICSICT.2008.4734488 9781424421855 http://scholarbank.nus.edu.sg/handle/10635/84317 000265971000032 Scopus |
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10.1109/ICSICT.2008.4734488 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Yeo, Y.-C. |
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Conference or Workshop Item |
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Yeo, Y.-C. |
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Yeo, Y.-C. Towards ultimate CMOS performance with new stressor materials |
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Yeo, Y.-C. |
title |
Towards ultimate CMOS performance with new stressor materials |
title_short |
Towards ultimate CMOS performance with new stressor materials |
title_full |
Towards ultimate CMOS performance with new stressor materials |
title_fullStr |
Towards ultimate CMOS performance with new stressor materials |
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Towards ultimate CMOS performance with new stressor materials |
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towards ultimate cmos performance with new stressor materials |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/84317 |
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