Chua, G., Tay, C., Quan, C., Lin, Q., & ENGINEERING, M. (2014). Improvement of Rayleigh criterion with duty ratio characterization for subwavelength lithography.

Chua, G.S., C.J Tay, C. Quan, Q. Lin, and MECHANICAL ENGINEERING. Improvement of Rayleigh Criterion With Duty Ratio Characterization for Subwavelength Lithography. 2014.

Chua, G.S., et al. Improvement of Rayleigh Criterion With Duty Ratio Characterization for Subwavelength Lithography. 2014.