Chua, G., Tay, C., Quan, C., Lin, Q., & ENGINEERING, M. (2014). Improvement of Rayleigh criterion with duty ratio characterization for subwavelength lithography.

Chua, G.S., C.J Tay, C. Quan, Q. Lin, و MECHANICAL ENGINEERING. Improvement of Rayleigh Criterion With Duty Ratio Characterization for Subwavelength Lithography. 2014.

Chua, G.S., et al. Improvement of Rayleigh Criterion With Duty Ratio Characterization for Subwavelength Lithography. 2014.