Measuring interface parameters and toughness - A computational study

Measuring interface parameters and toughness - A computational study

10.1016/S1359-6454(00)00374-8

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Bibliographic Details
Main Authors: Liu, P., Cheng, L., Zhang, Y.W.
Other Authors: MECHANICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Interface
Thin films
Toughness
Online Access:http://scholarbank.nus.edu.sg/handle/10635/85380
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/85380

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