APA引文

Zhu, J., Yeap, K., Zeng, K., Lu, L., & ENGINEERING, M. (2014). Nanomechanical characterization of sputtered RuO2 thin film on silicon substrate for solid state electronic devices.

Chicago Style Citation

Zhu, J., K.B Yeap, K. Zeng, L. Lu, and MECHANICAL ENGINEERING. Nanomechanical Characterization of Sputtered RuO2 Thin Film On Silicon Substrate for Solid State Electronic Devices. 2014.

MLA引文

Zhu, J., et al. Nanomechanical Characterization of Sputtered RuO2 Thin Film On Silicon Substrate for Solid State Electronic Devices. 2014.