Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers

Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers

Proceedings of the IEEE Ultrasonics Symposium

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Bibliographic Details
Main Authors: Lim, L.C., Kumar, F.J.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86043
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/86043

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