Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film

10.1063/1.3259655

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Main Authors: Wu, J., Kang, G., Wang, J.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86285
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-862852023-10-29T22:37:03Z Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film Wu, J. Kang, G. Wang, J. MATERIALS SCIENCE AND ENGINEERING 10.1063/1.3259655 Applied Physics Letters 95 19 - APPLA 2014-10-07T09:48:54Z 2014-10-07T09:48:54Z 2009 Article Wu, J., Kang, G., Wang, J. (2009). Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film. Applied Physics Letters 95 (19) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3259655 00036951 http://scholarbank.nus.edu.sg/handle/10635/86285 000272756600056 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.3259655
author2 MATERIALS SCIENCE AND ENGINEERING
author_facet MATERIALS SCIENCE AND ENGINEERING
Wu, J.
Kang, G.
Wang, J.
format Article
author Wu, J.
Kang, G.
Wang, J.
spellingShingle Wu, J.
Kang, G.
Wang, J.
Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film
author_sort Wu, J.
title Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film
title_short Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film
title_full Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film
title_fullStr Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film
title_full_unstemmed Electrical behavior and oxygen vacancies in BiFeO3/[(Bi 1/2Na1/2)0.94Ba0.06] TiO3 thin film
title_sort electrical behavior and oxygen vacancies in bifeo3/[(bi 1/2na1/2)0.94ba0.06] tio3 thin film
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/86285
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