Thickness and coupling effects in bilayered multiferroic CoFe 2O4/Pb (Zr0.52Ti0.48)O3 thin films

10.1063/1.2940014

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Bibliographic Details
Main Authors: Sim, C.H., Pan, A.Z.Z., Wang, J.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86808
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Institution: National University of Singapore