On the upper truncated Weibull distribution and its reliability implications

Reliability Engineering and System Safety

Saved in:
Bibliographic Details
Main Authors: Zhang, T., Xie, M.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/87357
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:Reliability Engineering and System Safety