Reliability assessment for particle-induced failures in multi-generation hard disk drives

Microsystem Technologies

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Bibliographic Details
Main Authors: Tang, L.-C., Ng, Q.Y., Cheong, W.-T., Goh, J.-S.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/87391
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Institution: National University of Singapore