Fourth International Conference on Quality and Reliability (ICQR2005)

Quality and Reliability Engineering International

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Bibliographic Details
Main Authors:	Yuan, L., Min, X.
Other Authors:	INDUSTRIAL & SYSTEMS ENGINEERING
Format:	Editorial
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/87426
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-874262023-08-22T08:17:40Z Fourth International Conference on Quality and Reliability (ICQR2005) Yuan, L. Min, X. INDUSTRIAL & SYSTEMS ENGINEERING Quality and Reliability Engineering International 23 1 1- QREIE 2014-10-07T10:27:58Z 2014-10-07T10:27:58Z 2007-02 Editorial Yuan, L., Min, X. (2007-02). Fourth International Conference on Quality and Reliability (ICQR2005). Quality and Reliability Engineering International 23 (1) : 1-. ScholarBank@NUS Repository. 07488017 http://scholarbank.nus.edu.sg/handle/10635/87426 000244212800001 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Quality and Reliability Engineering International
author2	INDUSTRIAL & SYSTEMS ENGINEERING
author_facet	INDUSTRIAL & SYSTEMS ENGINEERING Yuan, L. Min, X.
format	Editorial
author	Yuan, L. Min, X.
spellingShingle	Yuan, L. Min, X. Fourth International Conference on Quality and Reliability (ICQR2005)
author_sort	Yuan, L.
title	Fourth International Conference on Quality and Reliability (ICQR2005)
title_short	Fourth International Conference on Quality and Reliability (ICQR2005)
title_full	Fourth International Conference on Quality and Reliability (ICQR2005)
title_fullStr	Fourth International Conference on Quality and Reliability (ICQR2005)
title_full_unstemmed	Fourth International Conference on Quality and Reliability (ICQR2005)
title_sort	fourth international conference on quality and reliability (icqr2005)
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/87426
_version_	1776258728878669824

Fourth International Conference on Quality and Reliability (ICQR2005)

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