Dependency of the tunneling decay coefficient in molecular tunneling junctions on the topography of the bottom electrodes

Dependency of the tunneling decay coefficient in molecular tunneling junctions on the topography of the bottom electrodes

10.1002/anie.201309506

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Bibliographic Details
Main Authors: Yuan, L., Jiang, L., Zhang, B., Nijhuis, C.A.
Other Authors: CHEMISTRY
Format: Article
Published: 2014
Subjects:
bottom electrodes
charge transport
molecular electronics
self-assembled monolayers
tunneling decay constant
Online Access:http://scholarbank.nus.edu.sg/handle/10635/93530
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/93530

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