Odd-even effects in charge transport across self-assembled monolayers

10.1021/ja1090436

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Bibliographic Details
Main Authors: Thuo, M.M., Reus, W.F., Nijhuis, C.A., Barber, J.R., Kim, C., Schulz, M.D., Whitesides, G.M.
Other Authors: CHEMISTRY
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/94412
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Institution: National University of Singapore