Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics

10.1109/19.816109

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Main Author: Chen, L.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95749
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-957492024-11-15T12:08:16Z Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics Chen, L. PHYSICS 10.1109/19.816109 IEEE Transactions on Instrumentation and Measurement 48 6 1031-1037 IEIMA 2014-10-16T09:15:23Z 2014-10-16T09:15:23Z 1999-12 Article Chen, L. (1999-12). Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics. IEEE Transactions on Instrumentation and Measurement 48 (6) : 1031-1037. ScholarBank@NUS Repository. https://doi.org/10.1109/19.816109 00189456 http://scholarbank.nus.edu.sg/handle/10635/95749 000084925000004 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/19.816109
author2 PHYSICS
author_facet PHYSICS
Chen, L.
format Article
author Chen, L.
spellingShingle Chen, L.
Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
author_sort Chen, L.
title Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
title_short Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
title_full Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
title_fullStr Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
title_full_unstemmed Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
title_sort amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/95749
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