Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy

Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy

Applied Surface Science

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Bibliographic Details
Main Authors: Chen, P., Xu, S.Y., Lin, J., Ong, C.K., Cui, D.F.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
ARXPS
LaNiO3
Laser MBE
Topmost surface
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95786
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/95786

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