Angular spreading measurements using MeV ion microscopes

Angular spreading measurements using MeV ion microscopes

10.1016/j.nimb.2012.11.035

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Bibliographic Details
Main Authors: Whitlow, H.J., Ren, M., Chen, X., Osipowicz, T., Van Kan, J.A., Watt, F.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Angular spreading
MeV ion microscope
Multiple scattering
STIM
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95793
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/95793

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